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test/dm: reset: Add reset_get_by_index[_nodev] test

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Add sample dm reset test for reset_get_by_index and
reset_get_by_index_nodev functionality code.

Cc: Stephen Warren <swarren@nvidia.com>
Signed-off-by: Jagan Teki <jagan@amarulasolutions.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
This commit is contained in:
Jagan Teki 2019-02-28 00:26:56 +05:30
parent ea9dc35aab
commit 41cdb28549
1 changed files with 23 additions and 0 deletions
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23
test/dm/reset.c
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@ -5,6 +5,7 @@
#include <common.h>
#include <dm.h>
#include <reset.h>
#include <dm/test.h>
#include <asm/reset.h>
#include <test/ut.h>
@ -15,6 +16,28 @@
/* This is the other reset phandle specifier handled by bulk */
#define OTHER_RESET_ID 2
/* Base test of the reset uclass */
static int dm_test_reset_base(struct unit_test_state *uts)
{
struct udevice *dev;
struct reset_ctl reset_method1;
struct reset_ctl reset_method2;
/* Get the device using the reset device */
ut_assertok(uclass_get_device_by_name(UCLASS_MISC, "reset-ctl-test",
&dev));
/* Get the same reset port in 2 different ways and compare */
ut_assertok(reset_get_by_index(dev, 1, &reset_method1));
ut_assertok(reset_get_by_index_nodev(dev_ofnode(dev), 1,
&reset_method2));
ut_asserteq(reset_method1.id, reset_method2.id);
return 0;
}
DM_TEST(dm_test_reset_base, DM_TESTF_SCAN_FDT);
static int dm_test_reset(struct unit_test_state *uts)
{
struct udevice *dev_reset;